Catalan Institution for Research and Advanced Studies, Spain
Jordi Arbiol graduated in Physics at Universitat de Barcelona (UB). He also obtained his PhD (European Doctorate and PhD Extraordinary Award) in the field of Transmission Electron Microscopy (TEM) applied to nanostructured materials. He was an Assistant Professor at UB. He has served as a Group Leader at Institut de Ciència de Materials de Barcelona, ICMAB-CSIC. He is currently the Vice President of the Spanish Microscopy Society (SME), apart from being a leader of the Group of Advanced Electron Nanoscopy at Institut Català de Nanociència i Nanotecnologia (ICN2), CSIC and The Barcelona Institute of Science and Technology (BIST). He has been awarded with the 2014 EMS Outstanding Paper Award, the EU40 Materials Prize 2014 (E-MRS), listed in the Top 40 under 40 Power List (2014) by The Analytical Scientist and the PhD Extraordinary Award in 2001 (UB).